报告题目：Characterization of grain boundaries in polycrystalline ZnO varistors
报告人：Pro. Dr. Christian Teichert
Characterization of grain boundaries in polycrystalline ZnO varistors
Institute of Physics, Montanuniversität Leoben, 8700 Leoben, Austria
Besides morphological characterization, atomic-force microscopy (AFM) based techniques can be employed to study electrical properties on the nanometer scale via conductive atomic-force microscopy (C-AFM) and Kelvin Probe Force Microscopy . This will be demonstrated to study grain boundary characteristics of polycrystalline ZnO multilayer varistors [2-4]. The studies are complemented by micro four-point probe measurements . The results are related to structural information obtained by electron back-scattering diffraction (EBSD). With vector response force microscopy (VPFM), recently applied to study commercial PZT ceramics , we are even able to reveal ZnO twins which are not accessible by EBSD.
Work has been done in collaboration with M. Kratzer, M. Lasnik, M. Schloffer, I. Beinik, A. Andreev, A. Nevosad, M. Deluca, S. Röhrig, N. Reidl, M. Hofstätter, and P. Supancic (all Leoben).
 C. Teichert, I. Beinik, in “Scanning Probe Microscopy in Nanoscience and Nanotechnology”, Vol. 2, Edited by B. Bhushan, (ISBN 978-3-642-10496-1) (Springer-Verlag, Berlin, 2011), pp. 691-721.
 M. Schloffer, et al., J. Eur. Ceram. Soc. 30 (2010) 1761.
 A. Nevosad, et al., Proc. SPIE 8626 (2013) 862618.
 M. Hofstätter, et al., J. Eur. Ceram. Soc. 33 (2013) 3473.
 M. Kratzer, et al., Sci. Rep. 8 (2018) 422.
Dr. Teichert is an Professor at the University of Leoben, Austria, and Head of the Scanning Probe Microscopy Group Leoben. He studied Physics in Halle, Germany; Ph.D. in 1992; 1992/93 Postdoc (Alexander von Humboldt fellowship) Research Center Juelich, Germany; 1993-1996 Postdoc UW Madison, U.S., 1996/97 Postdoc, Max Planck Institute of Microstructure Physics, Halle, Germany; 1997Assistant Professor and 2001 Associate Professor, University of Leoben; 2002 Gaede Prize of the German Vacuum Society. His research interest is Atomic Force Microscopy based nanostructure research with focus on pattern formation in thin film growth and electrical properties of semiconductor nanostructures. He has organized several International Nanoscience Workshops. Currently, he is the elected chair of the Nanometer Structure Division of the International Union of Vacuum Science, Technology and Application (IUVSTA). He has more than 170 publications: 130 in peer reviewed international journals; 12 book chapters, 28 conference proceedings, 2 patents granted, 10 popular science articles; 55 invited talks at International Conferences and 120 invited talks at Research Institutions; and his Hirsch factor H=25(more than 3400 citations).